DocumentCode :
3355824
Title :
Design and development of trigger-driven readout with X-ray SOI pixel sensor
Author :
Ryu, Syukyo Gando ; Takeda, Ayaki ; Nakashima, Shinya ; Tsuru, Takeshi Go ; Ikemoto, Y. ; Arai, Yasuo ; Imamura, T. ; Ohmoto, T. ; Iwata, A.
Author_Institution :
Dept. of Phys., Kyoto Univ., Kyoto, Japan
fYear :
2011
fDate :
23-29 Oct. 2011
Firstpage :
1197
Lastpage :
1200
Abstract :
We have been developing a monolithic active pixel sensor with the Silicon-On-Insulator (SOI) CMOS technology, called SOIPIX, for future X-ray astronomical satellite missions. The goal of SOIPIX is to replace the X-ray CCD, which is the standard detector in the field, by offering superior time resolution (~10 μs) and wider bandpass (0.5 keV - 40 keV) in addition to having comparable performances in imaging spectroscopy. In the previous work, we built a SOIPIX prototype, XRPIX1, and confirmed the basic X-ray performance of imaging spectroscopy in a mode reading out the whole area (all pixels). The next step is to realize a high-speed and intelligent readout for X-ray detection. XRPIX1 contains trigger circuit in each pixel to detect an X-ray photon and is capable of direct access to the local pixels to read out the signal amplitude. We report on the design and development of a trigger-driven readout system with XRPIX1. We present the first resolved X-ray spectra of Cu+Mo and Am-241 obtained in the trigger-driven mode.
Keywords :
CMOS integrated circuits; X-ray detection; X-ray spectra; charge-coupled devices; nuclear electronics; readout electronics; silicon radiation detectors; silicon-on-insulator; trigger circuits; Am-241; Cu; Mo; SOIPIX prototype; X-ray CCD; X-ray SOI pixel sensor; X-ray detection; X-ray performance; X-ray photon; XRPIX1; future X-ray astronomical satellite missions; high-speed intelligent readout; imaging spectroscopy; monolithic active pixel sensor; resolved X-ray spectra; signal amplitude; silicon-on-insulator CMOS technology; time resolution; trigger circuit; trigger-driven mode; trigger-driven readout system; Active pixel sensor (APS); Silicon-On-Insulator (SOI); X-ray; correlated double sampling (CDS); intra-pixel trigger; readout noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
ISSN :
1082-3654
Print_ISBN :
978-1-4673-0118-3
Type :
conf
DOI :
10.1109/NSSMIC.2011.6154601
Filename :
6154601
Link To Document :
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