Title :
Integration of 0/1-level packaged RF-MEMS devices on MCM-D at millimeter-wave frequencies
Author :
Carchon, Geert ; Jourdain, Anne ; Vendier, Olivier ; Schoebel, Joerg ; Tilmans, Harrie A C
Author_Institution :
Dept. of Integrated Syst., IMEC, Leuven, Belgium
fDate :
31 May-3 June 2005
Abstract :
This paper reports on the optimization of 0/1-level packaged CPW lines and RF-MEMS switches up to millimeter wave frequencies. The 0-level package consists of an on-chip cavity obtained by flip-chip mounting a capping chip over the RF-MEMS device using BCB (BenzoCyclo-butene) as the bonding and sealing material. The 0-level coplanar RF feedthroughs are implemented using BCB as the dielectric; gold stud-bumps and thermocompression are used for realizing the 1-level package. The 0-level packaged switches have been flip-chip mounted on a multi-layer thin-film interconnect substrate using a high-resistivity Si carrier with embedded passives and substrate cavities. The insertion loss of a single 0/1-level transition is below -0.15dB at 50GHz. The measured return loss of a 0/1-level packaged 50Q CPW line remains better than -19dB up to 71GHz and better than -15dB up to 90GHz.
Keywords :
coplanar waveguides; dielectric materials; flip-chip devices; lead bonding; micromechanical devices; organic compounds; radiofrequency integrated circuits; silicon; substrates; 0.15 dB; 0/1-level packaging; 15 dB; 19 dB; 50 GHz; 50 ohm; 71 GHz; 90 GHz; BCB; CPW; RF-MEMS devices; benzocyclo-butene; bonding material; coplanar waveguides; dielectric material; flip-chip mounting; gold stud-bumps; insertion loss; millimeter-wave frequency; multilayer thin-film interconnect substrate; on-chip cavity; return loss; sealing material; thermocompression; Bonding; Coplanar waveguides; Dielectric substrates; Dielectric thin films; Gold; Packaging; Radio frequency; Radiofrequency microelectromechanical systems; Sealing materials; Switches;
Conference_Titel :
Electronic Components and Technology Conference, 2005. Proceedings. 55th
Print_ISBN :
0-7803-8907-7
DOI :
10.1109/ECTC.2005.1442015