DocumentCode
3356069
Title
A flexible VHDL test bench architecture
Author
May, Phil
Author_Institution
Motorola Inc., Scottsdale, AZ, USA
fYear
1992
fDate
11-14 Oct 1992
Firstpage
979
Abstract
The author explores test bench designs, based on a flexible architecture, for the testing of systems and subsystems modeling in VHDL. Consideration is given to test bench functionality, and interface designs including the user interface and the interface to the unit under test (UUT). The discussion of the user interface includes test vector input methods as well as techniques for handling test result output. The discussion of the UUT interfaces covers interface design along with techniques for changing this interface as the design of the system progresses (e.g., changing from abstract record passing I/O at early stages of design to physical I/O models as the design matures). A modular design with many reusable clocks forms the basis of the architectures presented
Keywords
VLSI; automatic testing; integrated circuit testing; specification languages; UUT interfaces; flexible VHDL test bench architecture; interface designs; modular design; test bench functionality; test vector input methods; unit-under-test interfaces; user interface; Buildings; Electronic equipment testing; Government; Signal processing; System testing; User interfaces;
fLanguage
English
Publisher
ieee
Conference_Titel
Military Communications Conference, 1992. MILCOM '92, Conference Record. Communications - Fusing Command, Control and Intelligence., IEEE
Conference_Location
San Diego, CA
Print_ISBN
0-7803-0585-X
Type
conf
DOI
10.1109/MILCOM.1992.243961
Filename
243961
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