• DocumentCode
    3356069
  • Title

    A flexible VHDL test bench architecture

  • Author

    May, Phil

  • Author_Institution
    Motorola Inc., Scottsdale, AZ, USA
  • fYear
    1992
  • fDate
    11-14 Oct 1992
  • Firstpage
    979
  • Abstract
    The author explores test bench designs, based on a flexible architecture, for the testing of systems and subsystems modeling in VHDL. Consideration is given to test bench functionality, and interface designs including the user interface and the interface to the unit under test (UUT). The discussion of the user interface includes test vector input methods as well as techniques for handling test result output. The discussion of the UUT interfaces covers interface design along with techniques for changing this interface as the design of the system progresses (e.g., changing from abstract record passing I/O at early stages of design to physical I/O models as the design matures). A modular design with many reusable clocks forms the basis of the architectures presented
  • Keywords
    VLSI; automatic testing; integrated circuit testing; specification languages; UUT interfaces; flexible VHDL test bench architecture; interface designs; modular design; test bench functionality; test vector input methods; unit-under-test interfaces; user interface; Buildings; Electronic equipment testing; Government; Signal processing; System testing; User interfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Military Communications Conference, 1992. MILCOM '92, Conference Record. Communications - Fusing Command, Control and Intelligence., IEEE
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0585-X
  • Type

    conf

  • DOI
    10.1109/MILCOM.1992.243961
  • Filename
    243961