Determine two-port S-parameters from one-port measurements using calibration substrate standards

A technique for determining two port S-parameters from one port measurements using calibration substrate standards is described in this paper. Closed form formulas are derived to facilitate conversion from one port reflection measurements to two-port S-parameters. Comparisons are made to previously reported techniques. It is observed that the two-port S-parameters generated using SOL method is free of artificial ripples typically observed in two port S-parameters generated by the SO and the cascade methods.