• DocumentCode
    3356419
  • Title

    Effects of discontinuities and technological fluctuations on the RF performance of BGA packages

  • Author

    Ndip, Ivan ; John, Werner ; Reichl, Herbert

  • Author_Institution
    Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
  • fYear
    2005
  • fDate
    31 May-3 June 2005
  • Firstpage
    1769
  • Abstract
    The presence of discontinuities (e.g., vias, bends...) along a uniform signal path distorts the electromagnetic (EM) field pattern, resulting in signal integrity (SI) effects especially at RF/microwave frequencies. Such effects, which also arise when geometrical and material parameters of components in chips, packages and boards unexpectedly change during the fabrication process, may lead to a degradation of the system performance, if not accounted for at the genesis of the development process. In this work, we examine.the effects of discontinuities and technological fluctuations on the radio frequency (RF) performance of ball grid array (BGA) packages. For this purpose, an equivalent circuit model of the complete signal path´ in a BGA package was developed for frequencies up to 25 GHz. The impact of multiple bends and vias on the signal quality was studied using this model. Furthermore, effects of up to 30% variation in material and geometrical parameters of each package component on its electrical characteristics and on the RF performance of the entire package were also critically investigated using the wideband package model. Based on the results of these investigations, design guidelines which can then be applied at the beginning of the development process to reduce cost and time, were deduced.
  • Keywords
    ball grid arrays; electromagnetic fields; integrated circuit design; integrated circuit packaging; network analysis; radiofrequency integrated circuits; BGA packages; RF performance; ball grid array packages; bends; design guidelines; discontinuities; electromagnetic field pattern; equivalent circuit model; fabrication process; signal integrity effects; signal quality; uniform signal path; vias; wideband package model; Degradation; Distortion; Electromagnetic fields; Fabrication; Fluctuations; Microwave frequencies; Packaging; RF signals; Radio frequency; System performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2005. Proceedings. 55th
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-8907-7
  • Type

    conf

  • DOI
    10.1109/ECTC.2005.1442035
  • Filename
    1442035