Title :
Characterization Of Semiconductor Surfaces And Interfaces By Non-linear Spectroscopy
Author_Institution :
T. J. Watson Research Center
Keywords :
Atom optics; Atomic layer deposition; Atomic measurements; Nonlinear optics; Optical films; Optical harmonic generation; Optical materials; Optical sensors; Probes; Spectroscopy;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
Print_ISBN :
0-87942-550-4
DOI :
10.1109/LEOS.1990.690693
