DocumentCode
3356648
Title
Radiation damage evaluation on LYSO and LuYAP materials through dpa calculation assisted by Monte Carlo method
Author
Piñera, Ibrahin ; Abreu, Yamiel ; Van Espen, Piet ; Diaz, Angelina ; Leyva, Antonio ; Cruz, Carlos M.
Author_Institution
Center of Technol. Applic. & Nucl. Dev., Havana, Cuba
fYear
2011
fDate
23-29 Oct. 2011
Firstpage
1609
Lastpage
1611
Abstract
The aim of the present work is to study the radiation damage induced in LYSO and LuYAP crystals by the gamma radiation and the secondary electrons/positrons generated. The displacements per atom (dpa) distributions inside each material were calculated following the Monte Carlo assisted Classical Method (MCCM) introduced by the authors. As gamma sources were used Sc-44, Na-22 and V-48. Also the energy of gammas from the annihilation processes (511 keV) was included in the study. This procedure allowed studying the in-depth dpa distributions inside each crystal for all four sources. It was also possible to obtain the separate contribution from each atom to the total dpa. The LYSO crystals were found to receive more damage, mainly provoked by the displacements of silicon and oxygen atoms.
Keywords
Monte Carlo methods; gamma-ray effects; lutetium compounds; scintillation; secondary electron emission; solid scintillation detectors; LYSO radiation damage evaluation; Lu0.7Y0.3AlO3; Lu1.8Y0.2SiO5; LuYAP radiation damage evaluation; MCCM; Monte Carlo assisted classical method; Monte Carlo method; Na-22 gamma source; Sc-44 gamma source; V-48 gamma source; annihilation processes; displacements per atom distribution; dpa calculation; electron volt energy 511 keV; gamma radiation induced damage; oxygen atom displacement; secondary electron generation; secondary positron generation; silicon atom displacement; Atomic measurements; Materials; ClearPET; LYSO; LuYAP; Monte Carlo simulation; displacements per atom; gamma radiation;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location
Valencia
ISSN
1082-3654
Print_ISBN
978-1-4673-0118-3
Type
conf
DOI
10.1109/NSSMIC.2011.6154643
Filename
6154643
Link To Document