• DocumentCode
    3356818
  • Title

    The origins of image contrast in SEAM of ferroelectric semiconductor, ceramics and single crystal: BaTiO3

  • Author

    Zhang, Bingyang ; Yang, Yang ; Jiang, Fuming ; Yin, Qingnti

  • Author_Institution
    Inst. of Ceramics, Acad. Sinica, Shanghai, China
  • fYear
    1996
  • fDate
    25-30 Sep 1996
  • Firstpage
    864
  • Lastpage
    869
  • Abstract
    A relatively new imaging technique, scanning electron-acoustic microscope (SEAM), was used to investigate the ferroelectric semiconductors, ferroelectric ceramics and single crystal: BaTiO3 . The subsurface defects of ferroelectric semiconductors and the domain structures of ferroelectric ceramics and single crystal were observed without any pre-handling to the samples in the electron-acoustic imaging of these materials. The origins of image contrast in SEAM of these materials have been discussed based on differently experimental conditions
  • Keywords
    acoustic microscopy; barium compounds; ceramics; electric domains; ferroelectric semiconductors; scanning electron microscopy; BaTiO3; SEAM; ceramic; domain structure; ferroelectric semiconductor; image contrast; scanning electron-acoustic microscopy; single crystal; subsurface defects; Acoustic imaging; Acoustic waves; Ceramics; Crystalline materials; Electron beams; Ferroelectric materials; Grain boundaries; Scanning electron microscopy; Semiconductor materials; Surface acoustic waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 1996. (ISE 9), 9th International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-2695-4
  • Type

    conf

  • DOI
    10.1109/ISE.1996.578221
  • Filename
    578221
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3356818