DocumentCode :
3357147
Title :
An investigation of single-crystal PbTe for nuclear radiation detector applications
Author :
Kim, Geehyun ; Hammig, Mark D.
Author_Institution :
Nucl. Eng. & Radiol. Sci. Dept., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2011
fDate :
23-29 Oct. 2011
Firstpage :
1732
Lastpage :
1737
Abstract :
Lead chalcogenide materials, with high atomic numbers for favorable detection efficiency and narrow band-gaps for fine energy resolution, hold promise as a medium for the detection of ionizing radiation. Their viability as a material basis for detectors is assessed by characterizing p-type lead telluride (PbTe) in single crystal form. Following mechanical polishing and chemical etching of the material, metallic electrodes were deposited and current-voltage (I-V) and capacitance-voltage (C-V) characteristics of the material were investigated at both room and liquid nitrogen temperatures. High charge carrier concentrations were calculated and shallow depletion layers were developed. Alpha particles, from an 241Am source were impinged upon the PbTe crystal, and an energy spectrum was obtained which demonstrated the positive response of the material to the incident quanta.
Keywords :
radioactive sources; semiconductor counters; 241Am source; PbTe crystal; alpha particles; detection efficiency; energy spectrum; fine energy resolution; high atomic numbers; lead chalcogenide materials; liquid nitrogen temperature; material capacitance-voltage characteristic; material chemical etching; material current-voltage characteristic; material mechanical polishing; mechanical polishing; metallic electrodes; narrow band-gaps; nuclear radiation detector applications; p-type lead telluride; room temperature; semiconductor ionizing radiation detectors; shallow depletion layers; single crystal form; single-crystal PbTe investigation; Atomic measurements; Capacitance; Size measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
ISSN :
1082-3654
Print_ISBN :
978-1-4673-0118-3
Type :
conf
DOI :
10.1109/NSSMIC.2011.6154671
Filename :
6154671
Link To Document :
بازگشت