DocumentCode :
3357464
Title :
Test beam results of the GE1/1 prototype for a future upgrade of the CMS high-η muon system
Author :
Abbaneo, D. ; Abbrescia, M. ; Armagnaud, C. ; Aspell, P. ; Bagliesi, M.G. ; Ban, Y. ; Bally, S. ; Benussi, L. ; Berzano, U. ; Bianco, S. ; Bos, J. ; Bunkowski, K. ; Cai, J. ; Cecchi, R. ; Chatelain, J.P. ; Christiansen, J. ; Colafranceschi, S. ; Colaleo,
Author_Institution :
Phys. Dept., CERN, Geneva, Switzerland
fYear :
2011
fDate :
23-29 Oct. 2011
Firstpage :
1806
Lastpage :
1810
Abstract :
Gas Electron Multipliers (GEM) are an interesting technology under consideration for the future upgrade of the forward region of the CMS muon system, specifically in the 1.6 <; |η| <; 2:4 endcap region. With a sufficiently fine segmentation GEMs can provide precision tracking as well as fast trigger information. The main objective is to contribute to the improvement of the CMS muon trigger. The construction of large-area GEM detectors is challenging both from the technological and production aspects. In view of the CMS upgrade we have designed and built the largest full-size Triple-GEM muon detector, which is able to meet the stringent requirements given the hostile environment at the high-luminosity LHC. Measurements were performed during several test beam campaigns at the CERN SPS in 2010 and 2011. The main issues under study are efficiency, spatial resolution and timing performance with different inter-electrode gap configurations and gas mixtures. In this paper results of the performance of the prototypes at the beam tests will be discussed.
Keywords :
electron multiplier detectors; nuclear electronics; trigger circuits; AD 2010; AD 2011; CERN SPS; CMS high eta muon system upgrade; CMS muon system forward region; CMS muon trigger; fast trigger information; gas electron multipliers; large area GEM detectors; precision tracking information; triple GEM muon detector; Argon; Mesons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
ISSN :
1082-3654
Print_ISBN :
978-1-4673-0118-3
Type :
conf
DOI :
10.1109/NSSMIC.2011.6154688
Filename :
6154688
Link To Document :
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