DocumentCode :
3357524
Title :
Measurement of dielectric properties of liquid crystals in the THz range
Author :
Meriakri, V.V. ; Pan, Ci-Ling ; Pan, Ru-Pin ; Parkhomenko, M.P. ; Chigrai, E.E.
Author_Institution :
Lab. of Millimeter & Submillimeter Waves Spectrosc., Inst. of Radioengineering & Electron. Russian Acad. of Sci.es, Fryazino
fYear :
2008
fDate :
Sept. 29 2008-Oct. 4 2008
Firstpage :
109
Lastpage :
111
Abstract :
A simple and efficient method is proposed for measuring the dielectric properties of liquid crystals (LCs) in the millimeter-wave band. This method is based on measuring the minimum of the reflection coefficient and the frequency corresponding to this minimum for a structure consisting of two plane-parallel quartz plates and a layer of a liquid crystal sandwiched between these plates. The method was applied to measuring the characteristics of 5 CB and 8 CB LCs in the frequency range from 58 to 118 GHz. The measurements have shown that the real part of the complex refractive index of 5 CB LQ is somewhat less than its asymptotic value of 1.69 measured at frequency of 5 GHz and is close to the value of 1.65, which was measured at frequency of 250 GHz. As regards the imaginary part of the refractive index, the results obtained at frequencies of 0.65 and 250 GHz are greater than those obtained in our experiments by a factor of 3-4. We also measured the temperature dependence of the birefringence of both LCs.
Keywords :
birefringence; dielectric polarisation; light reflection; liquid crystals; permittivity; refractive index; submillimetre wave spectra; birefringence; dielectric properties; dispersion region; frequency 250 GHz; frequency 5 GHz; frequency 58 GHz to 118 GHz; liquid crystals; millimeter-wave band; orthogonal polarization; plane-parallel quartz plates; reflection coefficient; refractive index; Dielectric liquids; Dielectric measurements; Frequency measurement; Liquid crystals; Millimeter wave measurements; Millimeter wave technology; Reflection; Refractive index; Temperature dependence; Temperature measurement; Thz; dielectric properties; liquid cristals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Optoelectronics and Lasers, 2008. CAOL 2008. 4th International Conference on
Conference_Location :
Crimea
Print_ISBN :
978-1-4244-1973-9
Electronic_ISBN :
978-1-4244-1974-6
Type :
conf
DOI :
10.1109/CAOL.2008.4671935
Filename :
4671935
Link To Document :
بازگشت