Correlation between Te inclusion inspection by IR with spectral response performance for CZT sensor pack detectors

The impact of Te inclusion on CZT detector spectral response is studied using IR defect mapping and depth-sensitive performance measurement. For high quality CZT device structures with low Te inclusion density, the presence or absence of Te inclusions does not affect the measured detector spectral response. We conclude that the observed variation in energy resolution among pixels and across the thickness must be caused by defects not disclosed by IR inspection technique. In this work we also demonstrated the feasibility to achieve high quality, spectral performance for both monolithic 15 mm × 15 mm × 10 mm detector parts and sensor pack detectors with assemblies of 5 mm thickness CZT tiles.