Title :
Two-dimensional Orthogonal Masks For Texture Classification
Author :
Cohen, Paul ; LeDinh, C.T.
Author_Institution :
Ecole Polytechnique de Montreal
Keywords :
Convolution; Density functional theory; Eigenvalues and eigenfunctions; Energy measurement; Entropy; Feature extraction; Image analysis; Image texture analysis; Probability density function;
Conference_Titel :
Systems, Man, and Cybernetics, 1988. Proceedings of the 1988 IEEE International Conference on
Print_ISBN :
7-80003-039-3
DOI :
10.1109/ICSMC.1988.754232