• DocumentCode
    3357704
  • Title

    Texture removal for adaptive level set based iris segmentation

  • Author

    Zhang, Xiaobo ; Sun, Zhenan ; Tan, Tieniu

  • Author_Institution
    Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    1729
  • Lastpage
    1732
  • Abstract
    Level set based active contour method has been proposed for iris segmentation in recent years, but it can not converge to iris contours in real applications because of its sensitivity to local gradient extremes due to the complex iris texture. In this paper, a novel scheme is proposed to remove local gradient extremes before using level set directly. Firstly, we use two orthogonal ordinal filters to obtain robust gradient map. Then we localize the iris region on the gradient map by an improved Hough transform. After that, a Semantic Iris Contour Map is generated by combining the spatial information of coarse iris location and the gradient map as the edge indicator for level set segmentation. For robust and accurate segmentation, we propose a convergence criterion and a means of updating the parameters for level set. Finally, the accurate segmentation is obtained by the robust adaptive level set method. Encouraging results on ICE 2005 database and CASIA v3 database show the efficiency and effectiveness of our method.
  • Keywords
    Hough transforms; gradient methods; image segmentation; image texture; iris recognition; Hough transform; complex iris texture; convergence criterion; edge indicator; iris contours; iris segmentation; local gradient extremes; orthogonal ordinal filters; robust adaptive level set segmentation method; robust gradient map; semantic iris contour map; texture removal; Convergence; Databases; Ice; Iris; Iris recognition; Level set; Semantics; Iris segmentation; convergence criterion; level set; semantic iris contour map;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5652941
  • Filename
    5652941