DocumentCode :
3358015
Title :
Use Of Differential Imaging To Spatially Resolve Strain In Ingaas Optoelectronic Devices
Author :
Sizer, T., II ; Woodward, T.K. ; Siveo, D. ; Cho, A.Y. ; Chiu, T.-H.
Author_Institution :
AT&T Bell Laboratories
fYear :
1990
fDate :
4-9 Nov 1990
Firstpage :
624
Lastpage :
625
Keywords :
Capacitive sensors; Computer aided analysis; Gallium arsenide; Image resolution; Indium gallium arsenide; Optoelectronic devices; Photonic band gap; Quantum well devices; Spatial resolution; Strain measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
Print_ISBN :
0-87942-550-4
Type :
conf
DOI :
10.1109/LEOS.1990.690701
Filename :
690701
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3358015
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