Reliability by design a tool to reduce time-to-market

Author

Foo, S.W. ; Lien, W.L. ; Xie, M. ; van Geest, E.

Author_Institution

Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore

fYear

1995

fDate

28-30 Jun 1995

Firstpage

251

Lastpage

256

Abstract

Reliability of products plays a crucial role in retaining brand loyalty. The conventional approach to reliability analysis resorts to testing the prototype and entails long development time. This is undesirable for electronic products which have very short life cycle. Reliability by design using the stressor-susceptibility interaction model provides a way to address this dilemma. Management no longer have to forgo reliability analysis in the race to shorten time-to-market

Keywords

consumer electronics; product development; quality control; reliability theory; research and development management; R&D; development time; electronic products; life cycle; management; product reliability; reliability analysis; reliability by design; stressor-susceptibility interaction model; time-to-market; Circuit analysis computing; Consumer electronics; Design engineering; Integrated circuit reliability; Product development; Prototypes; Reliability engineering; Research and development management; Testing; Time to market;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering Management Conference, 1995. Global Engineering Management: Emerging Trends in the Asia Pacific., Proceedings of 1995 IEEE Annual International

Print_ISBN

0-7803-2799-3

Type

conf

DOI

10.1109/IEMC.1995.524588

Filename

524588