• DocumentCode
    3358266
  • Title

    Analytical analysis of effect of sampling plan on Cpk

  • Author

    Liu, X.Q.

  • Author_Institution
    Dept. of Quality & Reliability Assurance, AT&T Microelectron. Pte. Ltd., Singapore
  • fYear
    1995
  • fDate
    28-30 Jun 1995
  • Firstpage
    257
  • Lastpage
    259
  • Abstract
    The use and abuse of process capability indices (PCIs) have become topics of considerable controversy in the last few years. A simulation shows that the difference in Cpk´s estimated by three approaches, which are widely used in manufacturing industry, is at least 0.5. In this paper, the authors study analytically the differences in Cpk´s calculated by these three different approaches. A few analytical relationships among the Cpk´s are derived in this paper and are illustrated with a case study
  • Keywords
    management; manufacturing industries; quality control; Cpk; case study; manufacturing industry; process capability indices; quality management; sampling plan; simulation; Computational modeling; Control charts; Manufacturing industries; Microelectronics; Process control; Random number generation; Research and development management; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering Management Conference, 1995. Global Engineering Management: Emerging Trends in the Asia Pacific., Proceedings of 1995 IEEE Annual International
  • Print_ISBN
    0-7803-2799-3
  • Type

    conf

  • DOI
    10.1109/IEMC.1995.524589
  • Filename
    524589