Title :
Simulated nuclear radiation responses derived from nanocrystalline semiconductor assemblies
Author :
Hammig, Mark D. ; Kim, Geehyun ; Becchetti, Marc
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
Nanocrystalline semiconductor detectors comprised of either cadmium or lead chalcogenide nanoparticles have resulted in excellent energy resolution. For instance, a blended assembly of 4 nm PbSe star-shaped particles, has yielded an energy resolution of 0.42 % (1.5 keV) at 356 keV, compared with a resolution of 0.96 % (3.4 keV) for CZT and 0.39 % (1.4 keV) for HPGe. The spectra are characterized however, by x-ray escape features due to the high probability of photoelectric absorption in the lead-based assembly, as well as the high x-ray energies associated with high Z materials. In this paper, we simulate the spectral response of a composite detector composed of PbSe and para-MEH-PPV in order to aid in the identification of the various features.
Keywords :
cadmium; lead; semiconductor counters; PbSe star-shaped particles; cadmium nanoparticle; lead chalcogenide nanoparticle; lead-based assembly; nanocrystalline semiconductor assemblies; nanocrystalline semiconductor detectors; nuclear radiation; Assembly; Carbon; Detectors; Gold; Lead; Oxygen; Testing;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154753