Title :
Nanowire addressing in the face of uncertainty
Author :
Rachlin, E. ; Savage, J.E.
Author_Institution :
Dept. of Comput. Sci., Brown Univ., USA
Abstract :
Exploiting the high-potential of nanoscale architectures requires that they be controlled by CMOS technology. Such an interface, a decoder, must control many nanowires (NWs) with a small number of meso-scale wires (MWs). Multiple types of decoder have been proposed, each of which can be modelled as embedding resistive switches in NWs. In this paper we present a general model for NW decoders and use it to specify the criteria they must meet to function correctly and be fault-tolerant. To illustrate the power of our model, we derive the first bounds on the size of a fault-tolerant randomized contact decoder.
Keywords :
decoding; nanoelectronics; nanowires; switches; CMOS technology; NW decoders; fault tolerant computing; meso-scale wires; nanoscale architectures; nanowire decoder; Assembly; CMOS technology; Circuits; Decoding; Fault tolerance; Lithography; Semiconductor device modeling; Switches; Uncertainty; Wires;
Conference_Titel :
Emerging VLSI Technologies and Architectures, 2006. IEEE Computer Society Annual Symposium on
Conference_Location :
Karlsruhe
Print_ISBN :
0-7695-2533-4
DOI :
10.1109/ISVLSI.2006.66