• DocumentCode
    3358817
  • Title

    Finite state machine implementation with single-electron tunneling technology

  • Author

    Jialin Mi ; Chunhong Chen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Windsor Univ., Ont.
  • fYear
    2006
  • fDate
    2-3 March 2006
  • Abstract
    In this paper we propose an implementation technique for finite state machines using single-electron tunneling (SET) technology towards ultra-low power dissipation. We take an example from radio-frequency identification (RFID) systems, and implement the state machine based on single-electron encoded logic (SEEL). The circuit is simulated by SIMON (a simulator for SET circuits), and is compared favorably with its CMOS counterpart
  • Keywords
    finite state machines; logic circuits; logic design; low-power electronics; radiofrequency identification; single electron devices; RFID systems; SEEL; SET circuits; SET technology; circuit simulation; finite state machine; radio-frequency identification systems; single-electron encoded logic; single-electron tunneling technology; ultra-low power dissipation; Automata; CMOS logic circuits; CMOS technology; Circuit simulation; Electrons; Logic design; Power dissipation; Radiofrequency identification; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging VLSI Technologies and Architectures, 2006. IEEE Computer Society Annual Symposium on
  • Conference_Location
    Karlsruhe
  • Print_ISBN
    0-7695-2533-4
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2006.45
  • Filename
    1602446