Characterization of charge collection in various semiconductor sensors with energetic protons and Timepix device

In this work we use the Timepix chip as a multichannel tester for evaluation of properties of different semiconductor sensors. Different sensors bump-bonded to a Timepix readout chip and exposed to energetic protons with different incident angles and energies have been investigated. Data from each recorded proton track were processed individually. The extent of the charge sharing effect was evaluated along the proton track at different sensor depths. The level of charge sharing is affected by the time of charge collection which is related to the local intensity of the electric field in the sensor. This method can provide a 3D map of the electric field in the whole sensor volume.