DocumentCode :
3359087
Title :
Reliability-aware SOC voltage islands partition and floorplan
Author :
Shengqi Yang ; Wolf, W. ; Vijaykrishnan, N. ; Yuan Xie
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., USA
fYear :
2006
fDate :
2-3 March 2006
Abstract :
Based on the proposed reliability characterization model, reliability-bounded low-power design as a methodology to balance reliability enhancement and power reduction in chip design, for the first time, is illustrated. Voltage island partitioning and floorplanning for system-on-a-chip (SOC) design is used as a case study for this reliability aware methodology. The proposed methodology partitions all SOC components into different voltage islands with power reduction and guaranteed system reliability. Experiments show that for a typical SOC the algorithm execution time is within several minutes while achieving 12% to 23% power reduction. Extended SOC algorithm partitions and floorplans the voltage islands within 2.5 to 29.7 minutes and achieved 9.74% to 18.50% power reduction.
Keywords :
integrated circuit reliability; logic partitioning; low-power electronics; system-on-chip; 2.5 to 29.7 mins; SOC design; floorplanning; low power design; reliability characterization model; system on chip; voltage islands partitioning; Buffer storage; Chip scale packaging; Circuits; Design methodology; Dynamic voltage scaling; Energy consumption; Partitioning algorithms; Power system modeling; Power system reliability; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging VLSI Technologies and Architectures, 2006. IEEE Computer Society Annual Symposium on
Conference_Location :
Karlsruhe
Print_ISBN :
0-7695-2533-4
Type :
conf
DOI :
10.1109/ISVLSI.2006.79
Filename :
1602462
Link To Document :
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