DocumentCode :
3359123
Title :
Probabilistic Facial Trait Code for face recognition
Author :
Lee, Ping-Han ; Wu, Szu-Wei ; Hsu, Gee-Sern ; Hung, Yi-Ping
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
2429
Lastpage :
2432
Abstract :
Recently, a new facial encoding scheme, namely Facial Trait Code (FTC), was proposed. FTC encoded human faces into a series of integers. Distances between codewords of different people were maximized during the code construction. FTC was applied to solve face recognition, and was reported with promising verification rates. However, due to several simplifications in the FTC encoding, its performance degraded considerably when there were only few images per individual available for enrollment in the gallery sets, or when the probe set included faces under large variations in illumination and expression. In this paper, we proposed the Probabilistic Facial Trait Code (PFTC) with a novel encoding scheme and a probabilistic codeword distance measure. The impact made by illumination and expression variations were also handled in the construction of PFTC. The proposed PFTC was evaluated and compared with state-of-the-art algorithms, including the FTC, the algorithm using sparse representation, and the one using Local Binary Pattern. PFTC out-performed the algorithms compared in this study in most scenarios.
Keywords :
face recognition; image coding; probability; FTC encoded human faces; FTC encoding; PFTC; code construction; codewords; face recognition; facial encoding scheme; gallery sets; local binary pattern; probabilistic codeword distance measure; probabilistic facial trait code; sparse representation; state-of-the-art algorithms; verification rates; Face; Face recognition; Feature extraction; Lighting; Probabilistic logic; Probes; Training; face recognition; facial trait code;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5653046
Filename :
5653046
Link To Document :
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