Title :
Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology
Author :
Mehta, V.J. ; Marek-Sadowska, M. ; Kun-Han Tsai ; Rajski, J.
Author_Institution :
Dept. of ECE, UCSB, Santa Barbara, CA
Abstract :
With feature sizes shrinking, manufacturing defects and parameter variations often cause design timing failures. Crosstalk coupling is one of such causes. It is essential that timing failures be correctly and quickly diagnosed. The authors present a methodology to diagnose the delay-defect in presence of crosstalk, given the physical information such as crosstalk coupling capacitance, neighborhood information and SDF delay information. The authors provide diagnosis results for 180, 130, 90 and 65 nm technologies
Keywords :
crosstalk; integrated circuit testing; nanotechnology; timing jitter; 130 nm; 180 nm; 65 nm; 90 nm; SDF delay information; crosstalk coupling; delay-defect diagnosis; manufacturing defects; nanometer technology; timing defect diagnosis; timing failures; Cause effect analysis; Circuit faults; Coupling circuits; Crosstalk; Delay; Fault diagnosis; Integrated circuit interconnections; Manufacturing; Testing; Timing;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0291-3
DOI :
10.1109/TEST.2006.297626
