• DocumentCode
    335935
  • Title

    Synchronized shocks reduce defibrillation threshold

  • Author

    Jones, Janice L. ; Noe, William A. ; Moulder, J. Christopher ; Tovar, Oscar H. ; Hsu, William ; Lin, Yayun

  • Author_Institution
    Dept. of Physiol. & Biophys., Georgetown Univ., Washington, DC, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    30 Oct-2 Nov 1997
  • Firstpage
    145
  • Abstract
    The extension of refractoriness hypothesis predicts that defibrillation success can be improved by synchronizing shocks to action potentials from cells in low intensity regions. Threshold should be lower for shocks delivered “early” in these action potentials than for shocks delivered “late”. To test this hypothesis, defibrillating shocks were synchronized to monophasic action potentials recorded from a low intensity region in isolated rabbit hearts (N=6). Probability-of-success curves were generated for “early” and “late” shocks. The authors found that I50 for “early” shocks was 17% lower than I 50 for “late” shocks (p<0.05). This corresponds to a 31% decrease in E50 The relative standard deviation of I50 decreased from 32% for “late” shocks to 18% for “early” shocks. Standard deviations at all success percentiles were larger for “late” shocks. These results suggest that synchronizing shocks to action potentials from a low intensity region may reduce defibrillation threshold and inter-subject variability
  • Keywords
    bioelectric potentials; cellular biophysics; defibrillators; electric shocks; action potentials; cardiac electrophysiology; defibrillation success; early shocks; inter-subject variability; isolated rabbit hearts; late shocks; low intensity region cells; monophasic action potentials; probability-of-success curves; refractoriness hypothesis; Catheters; Defibrillation; Electric shock; Electrocardiography; Electrodes; Heart; Physiology; Rabbits; Testing; Veins;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-4262-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.1997.754487
  • Filename
    754487