A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior

Author

Desineni, R. ; Poku, O. ; Blanton, R. D Shawn

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA

fYear

2006

fDate

Oct. 2006

Firstpage

1

Lastpage

10

Abstract

DIAGNOSIX is a comprehensive fault diagnosis methodology for characterizing failures in digital ICs. Using limited layout information, DIAGNOSIX automatically extracts a fault model for a failing IC by analyzing the behavior of the physical neighborhood surrounding suspect lines. Results from several simulated and over 800 failing ICs reveal a significant improvement in localization. More importantly, the output of DIAGNOSIX is an accurate model of the logic-level defect behavior that provides useful insight into the actual defect mechanism. Experiment results for the failing chips with successful physical failure analysis reveal that the extracted faults accurately describe the actual defects

Keywords

digital integrated circuits; failure analysis; fault diagnosis; integrated circuit modelling; DIAGNOSIX; accurate defect behavior extraction; accurate defect behavior localization; automatic extraction; digital integrated circuit; failure analysis; fault diagnosis; fault model; layout information; logic diagnosis; logic-level defect behavior; Bridge circuits; Circuit faults; Data mining; Failure analysis; Fault diagnosis; Integrated circuit layout; Integrated circuit modeling; Integrated circuit yield; Logic; Signal processing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2006. ITC '06. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

1-4244-0292-1

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2006.297627

Filename

4079305