• DocumentCode
    3359406
  • Title

    Design for Board and System Level Structural Test and Diagnosis

  • Author

    Toai Vo ; Zhiyuan Wang ; Eaton, T. ; Ghosh, Prosenjit ; Huai Li ; Young Lee ; Weili Wang ; Rong Fang ; Singletary, D. ; Xinli Gu

  • Author_Institution
    Cisco Syst. Inc., San Jose, CA
  • fYear
    2006
  • fDate
    22-27 Oct. 2006
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The success of system test is measured by test quality and cost. System test quality and cost rely on several factors, such as component and board test quality, system test completeness, the support of system diagnostics, and a process that controls overall quality, resource and cost balances. Traditional structural test techniques used at the component level can achieve both high test quality and low test costs. This paper describes an approach to extend the functionalities of structural test techniques to the board and system level to improve the test accessibility, test time, and diagnostic capability. This approach has become practice in a large telecommunication company and the benefits received from this practice are tremendous. Examples will be given at the end of the paper
  • Keywords
    application specific integrated circuits; automatic test equipment; built-in self test; fault diagnosis; board design; diagnostic capability; system diagnostics; system level structural test; system test cost; system test quality; test accessibility; test time; Application specific integrated circuits; Automatic testing; Control systems; Costs; Delay; Logic devices; Logic testing; Manufacturing; Process control; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0291-3
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297631
  • Filename
    4079309