DocumentCode :
335945
Title :
Importance of geometry in reconstructing endocardial electrograms from noncontact multielectrode cavitary probe data
Author :
Khoury, Dirar S.
Author_Institution :
Baylor College of Medicine, Houston, TX
Volume :
1
fYear :
1997
fDate :
Oct. 30 1997-Nov. 2 1997
Firstpage :
188
Lastpage :
190
Abstract :
Solving the inverse problem to reconstruct endocardial electrograms from cavitary probe data requires measuring cavitary electrograms and determining probecavity geometry. To identify the importance of geometry. endocardial electrograms were computed using two geometric models of the endocardium: (1) realistic. and (2) idealized. Endocardial electrograms were computed during pacing and were compared to directly measured electrograms at 8 sites during each paced rhythm. Using realistic geometry. computed electrograms were in excellent agreement with measured electrograms (r = 0.88; error in activation time = 4.7 ms). Whereas, the idealized geometry significantly increased the error in computed electrograms (r = 0.75; error in activation time = 9.9 ms). Therefore. in situ determination of realistic geometry is essential to successfully solve the inverse problem.
Keywords :
bioelectric potentials; biological tissues; biomedical electrodes; electrocardiography; inverse problems; medical signal processing; signal reconstruction; activation time error; computed electrograms; endocardial electrograms reconstruction; endocardial potentials; geometric models; geometry importance; idealized model; in situ determination; inverse problem; noncontact multielectrode cavitary probe data; pacing; probe-cavity geometry; realistic model; Computational geometry; Electric potential; Electric variables measurement; Electrodes; Electrophysiology; Heart; Inverse problems; Laplace equations; Probes; Solid modeling; Electrograms; inverse problem;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL, USA
ISSN :
1094-687X
Print_ISBN :
0-7803-4262-3
Type :
conf
DOI :
10.1109/IEMBS.1997.754500
Filename :
754500
Link To Document :
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