DocumentCode :
335953
Title :
Simulation study of coronary circulation using electronic circuit model for the coronary vessel
Author :
Ejaz, Tahseen ; Takemae, Tadashi ; Kosugi, Yukio ; Okubo, Shinchi ; Hongo, Minoru
Author_Institution :
Shizuoka University, Japan
Volume :
1
fYear :
1997
fDate :
Oct. 30 1997-Nov. 2 1997
Firstpage :
231
Lastpage :
234
Abstract :
In order to simulate the left coronary blood flow dynamically and to make the mechanisms of its characteristics clear, an electronic circuit model of the coronary vessel using Field Effect Transistor (FET) is proposed. As a result of the dynamic simulation using this circuit, the blood flow in the septal artery shows dominance in diastole compared to that in systole. And the flow in the veins of epimyocardium shows an inverse trend in the early systole. These waveforms are similar to those observed in real left coronary circulation. From these results, it can be predicted that the resistance of the coronary vessel has an integrational effect on the arterial pressure and its capacitance has a differential effect on the intramyocardial pressure and each of these two effects can play a very important role in determining the left coronary circulation.
Keywords :
blood vessels; cardiovascular system; equivalent circuits; haemodynamics; physiological models; FET model; arterial pressure; capacitance; coronary circulation simulation; coronary vessel; dominance in diastole; dynamic simulation; early systole; electronic circuit model; epimyocardium; intramyocardial pressure; inverse trend; left coronary blood flow; left coronary circulation; septal artery; vessel resistance; Arteries; Blood flow; Blood pressure; Circuit simulation; Electronic circuits; FETs; Medical simulation; Myocardium; Resistors; Veins; Coronary Circulation; Differential Effect; Dynamic Simulation; Integrational Effect; Intramyocardial Pressure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL, USA
ISSN :
1094-687X
Print_ISBN :
0-7803-4262-3
Type :
conf
DOI :
10.1109/IEMBS.1997.754512
Filename :
754512
Link To Document :
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