Title :
Test Structure and Testing of the Microsoft XBOX 360/sup TM/ Processor High Speed Front Side Bus
Author :
Pham, Tung ; Koehler, Brian ; Young, Daniel ; Bushard, Louis
Author_Institution :
IBM Syst. & Technol. Group Dev., Austin, TX
Abstract :
The microsoft XBOX 360/sup TM/ processor is a complex design with many multi-gigahertz, synchronous and asynchronous clock domains. One of the key design features is the high speed front side bus I/O system that consists of analog and digital elements that provide an interesting manufacturing test challenge for a low test cost, high volume, and high quality chip level application. This publication focuses on the test solution for the high speed custom logic that aligns the source synchronous clock to the associated receiver data
Keywords :
clocks; field buses; logic testing; microprocessor chips; system-on-chip; analog elements; asynchronous clock domains; digital elements; high speed custom logic; high speed front side bus I/O system; microsoft XBOX 360 processor; synchronous clock domains; Circuit testing; Clocks; Graphics; Logic testing; Phase locked loops; Physical layer; Protocols; System testing; System-on-a-chip; Wiring;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0291-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297639
