Optimizing the Cost of Test at Intel Using per Device Data

The optimization of Intel Corporation´s test process and test cost by the utilization of data from previous test steps and devices in order to make flow level and unit level testing decisions, including adaptive testing.. This optimization is external to traditional test flows and enables per device test content optimization at one test socket or between multiple sockets in a high volume manufacturing environment using online and offline data transfer systems, which manage the critical data between test sockets to be used for the adaptive testing algorithms themselves