DocumentCode :
3359779
Title :
Behavioral Test Economics
Author :
Davidson, Scott ; Ambler, Anthony ; Davidson, Helen
Author_Institution :
Sun Microsystems, Inc., Sunnyvale, CA
fYear :
2006
fDate :
Oct. 2006
Firstpage :
1
Lastpage :
9
Abstract :
This paper raises the issue of why test engineers often do not act in ways which test economics says are optimal. The new field of behavioral economics explains why people often do not act in their economic self interest, and the authors propose that some of the same principles, applied to testing, can explain some of the behavior of test engineers. The authors use several examples to illustrate these principles, and for each describe the underlying economic and behavioral economic principles behind them, and give recommendations for decision makers
Keywords :
cost-benefit analysis; design for testability; economics; production testing; behavioral economic principles; behavioral test economics; decision makers; test engineers; Automatic testing; Built-in self-test; Costs; Decision making; Economic forecasting; Engineering management; Industrial economics; Investments; Mathematics; Sun;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2006.297651
Filename :
4079329
Link To Document :
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