• DocumentCode
    3359853
  • Title

    A Study of Per-Pin Timing Jitter Scope

  • Author

    Yamaguchi, Takahiro J. ; Iwamoto, Satoshi ; Ishida, Masahiro ; Soma, Mani

  • Author_Institution
    Advantest Labs., Ltd., Sendai
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper proposes a new cost-effective solution for jitter testing. It measures timing jitter using a combination of voltage comparators in the pin electronics as a 1.6-bit ADC, and digital signal processing. It has been verified experimentally to be more than 96% accurate
  • Keywords
    analogue-digital conversion; automatic testing; comparators (circuits); digital signal processing chips; integrated circuit testing; timing jitter; 1.6-bit ADC; digital signal processing; jitter testing; per-pin timing jitter scope; pin electronics; voltage comparators; Clocks; Counting circuits; Digital signal processing; Frequency domain analysis; Histograms; Logic testing; Production; Time measurement; Timing jitter; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0292-1
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297654
  • Filename
    4079332
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3359853