Title :
A Study of Per-Pin Timing Jitter Scope
Author :
Yamaguchi, Takahiro J. ; Iwamoto, Satoshi ; Ishida, Masahiro ; Soma, Mani
Author_Institution :
Advantest Labs., Ltd., Sendai
Abstract :
This paper proposes a new cost-effective solution for jitter testing. It measures timing jitter using a combination of voltage comparators in the pin electronics as a 1.6-bit ADC, and digital signal processing. It has been verified experimentally to be more than 96% accurate
Keywords :
analogue-digital conversion; automatic testing; comparators (circuits); digital signal processing chips; integrated circuit testing; timing jitter; 1.6-bit ADC; digital signal processing; jitter testing; per-pin timing jitter scope; pin electronics; voltage comparators; Clocks; Counting circuits; Digital signal processing; Frequency domain analysis; Histograms; Logic testing; Production; Time measurement; Timing jitter; Voltage;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297654
