DocumentCode
3359856
Title
Trace-based Performance Analysis on Cell BE
Author
Biberstein, Marina ; Shvadron, Uzi ; Turek, Javier ; Mendelson, Bilha ; Chang, Moon S.
Author_Institution
IBM Haifa Res. Lab., Haifa
fYear
2008
fDate
20-22 April 2008
Firstpage
213
Lastpage
222
Abstract
The transition to multicore architectures creates significant challenges for programming systems. Taking advantage of specialized processing cores such as those in the Cell BE processor and managing all the required data movement inside the processor cannot be done efficiently without help from the software infrastructure. Alongside new programming models and compiler support for multicores, programmers need performance evaluation and analysis tools. In this paper, we present tools that help analyze the performance of applications executing on the Cell platform. The performance debugging tool (PDT) provides a means for recording significant events during program execution, maintaining the sequential order of events, and preserving important runtime information such as core assignment and relative timing of events. The trace analyzer (TA) reads and visualizes the PDT traces. We describe the architecture of the PDT and present several important use cases demonstrating the usage of PDT and TA to understand the performance of several workloads. We also discuss the overhead of tracing and its impact on the benchmark execution and performance analysis.
Keywords
program compilers; program debugging; software performance evaluation; software tools; analysis tools; compiler; multicore architectures; performance debugging tool; performance evaluation; program execution; programming models; programming systems; software infrastructure; trace-based performance analysis; Application software; Computer architecture; Debugging; Multicore processing; Performance analysis; Program processors; Programming profession; Runtime; Timing; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Performance Analysis of Systems and software, 2008. ISPASS 2008. IEEE International Symposium on
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-2232-6
Electronic_ISBN
978-1-4244-2233-3
Type
conf
DOI
10.1109/ISPASS.2008.4510753
Filename
4510753
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