• DocumentCode
    3359870
  • Title

    DIBPro: Automatic Diagnostic Program Generation Tool

  • Author

    Kalyanaraman, Venkat ; Kim, Bruce C. ; Variyam, Pramod ; Cherubal, Sasikumar

  • Author_Institution
    Texas Instruments Inc., Dallas, TX
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper describes the design and implementation of a tool for generating automatic diagnostic programs for mixed-signal device interface boards (DIB). The tool can be utilized on any ATE platform
  • Keywords
    automatic test equipment; automatic test pattern generation; automatic test software; program diagnostics; DIBPro; automatic diagnostic program generation; automatic test equipment; mixed-signal device interface boards; Automatic testing; Circuit faults; Circuit testing; Costs; Electronic equipment manufacture; Instruments; Pins; Production; Test equipment; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0292-1
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297655
  • Filename
    4079333
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3359870