Title :
Diagnosis with Limited Failure Information
Author :
Yu Huang ; Wu-Tung Cheng ; Tamarapalli, Nagesh ; Rajski, Janusz ; Klingenberg, Randy ; Will Hsu ; Yuan-Shih Chen
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR
Abstract :
This paper discusses the challenges associated with diagnosing chain integrity and system logic failures in the production test environment with limited failure information. The following three methods were proposed to enhance diagnosis resolution in this scenario: (1) static pattern re-ordering (2) dynamic pattern re-ordering (3) per-pin based diagnosis. Experimental results illustrate that per-pin based failure logging and diagnosis algorithms enable scan chain diagnosis in volume production environment. Successful application of per-pin based chain diagnosis is demonstrated with an industrial case
Keywords :
automatic test pattern generation; logic testing; production testing; chain integrity diagnosis; dynamic pattern reordering; failure information; per-pin diagnosis; scan chain diagnosis; static pattern reordering; system logic failures; Circuit faults; Circuit testing; Failure analysis; Graphics; Iterative algorithms; Logic testing; Production systems; Semiconductor device manufacture; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297660
