DocumentCode :
336001
Title :
A global optimization approach to electrical impedance tomography
Author :
Yang, Lixin ; Truyen, Bart ; Cornelis, Jan
Author_Institution :
Vrije Univ., Brussels, Belgium
Volume :
1
fYear :
1997
fDate :
30 Oct-2 Nov 1997
Firstpage :
437
Abstract :
The objective of this research is to improve upon existing reconstruction methods for static impedance imaging in electrical impedance tomography (EIT), both in speed and quality. A multigrid (MG) method is implemented to speed up the solution of the forward problem in EIT. Compared with direct solution methods and other iterative algorithms, it is more efficient, especially for large system models. On the other hand, due to the nonlinearity of the underlying problem, all existing methods suffer from local optima. In order to find global or at least near optima, simulated annealing (SA) is used to solve the inverse problem of EIT. Some strategies are also proposed, including the insertion of the forward problem in the annealing process, and the discretization of the configuration space. Simulation experiments show the advantages and feasibility of the proposed method
Keywords :
electric impedance imaging; image reconstruction; medical image processing; optimisation; simulated annealing; configuration space discretization; direct solution methods; electrical impedance tomography; forward problem; global optimization approach; iterative algorithms; local optima; medical diagnostic imaging; multigrid method; near optima; simulation experiments; static impedance imaging; Biomedical measurements; Conductivity; Geophysical measurements; Image reconstruction; Impedance; Inverse problems; Linear systems; Simulated annealing; Tomography; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1094-687X
Print_ISBN :
0-7803-4262-3
Type :
conf
DOI :
10.1109/IEMBS.1997.754573
Filename :
754573
Link To Document :
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