• DocumentCode
    336001
  • Title

    A global optimization approach to electrical impedance tomography

  • Author

    Yang, Lixin ; Truyen, Bart ; Cornelis, Jan

  • Author_Institution
    Vrije Univ., Brussels, Belgium
  • Volume
    1
  • fYear
    1997
  • fDate
    30 Oct-2 Nov 1997
  • Firstpage
    437
  • Abstract
    The objective of this research is to improve upon existing reconstruction methods for static impedance imaging in electrical impedance tomography (EIT), both in speed and quality. A multigrid (MG) method is implemented to speed up the solution of the forward problem in EIT. Compared with direct solution methods and other iterative algorithms, it is more efficient, especially for large system models. On the other hand, due to the nonlinearity of the underlying problem, all existing methods suffer from local optima. In order to find global or at least near optima, simulated annealing (SA) is used to solve the inverse problem of EIT. Some strategies are also proposed, including the insertion of the forward problem in the annealing process, and the discretization of the configuration space. Simulation experiments show the advantages and feasibility of the proposed method
  • Keywords
    electric impedance imaging; image reconstruction; medical image processing; optimisation; simulated annealing; configuration space discretization; direct solution methods; electrical impedance tomography; forward problem; global optimization approach; iterative algorithms; local optima; medical diagnostic imaging; multigrid method; near optima; simulation experiments; static impedance imaging; Biomedical measurements; Conductivity; Geophysical measurements; Image reconstruction; Impedance; Inverse problems; Linear systems; Simulated annealing; Tomography; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-4262-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.1997.754573
  • Filename
    754573