• DocumentCode
    3360167
  • Title

    Debug of the CELL Processor: Moving the Lab into Silicon

  • Author

    Riley, Mack ; Chelstrom, Nathan ; Genden, Mike ; Sawamura, Shoji

  • Author_Institution
    Syst. & Technol. Group, IBM Corp., Austin, TX
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    With 234 million transistors, making up 9 processing units and 3 asynchronous clock domains in a high speed design, the CELL processor clearly presents a challenge to debug work required during lab bring-up and test bring-up. Traditional multi-processing systems reap the benefit of standard system level debug practices, but as the system has moved into the silicon so must the access during bring-up. This paper explains some of the innovative debug features included in the CELL processor design that were critical for efficient bring-up in a limited access environment
  • Keywords
    integrated circuit testing; logic testing; microprocessor chips; system-on-chip; CELL processor debug; lab bring-up; limited access environment; test bring-up; Art; Bandwidth; Clocks; Hardware; Logic testing; Process design; Production; Semiconductor device testing; Silicon; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0292-1
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297671
  • Filename
    4079349