DocumentCode :
3360167
Title :
Debug of the CELL Processor: Moving the Lab into Silicon
Author :
Riley, Mack ; Chelstrom, Nathan ; Genden, Mike ; Sawamura, Shoji
Author_Institution :
Syst. & Technol. Group, IBM Corp., Austin, TX
fYear :
2006
fDate :
Oct. 2006
Firstpage :
1
Lastpage :
9
Abstract :
With 234 million transistors, making up 9 processing units and 3 asynchronous clock domains in a high speed design, the CELL processor clearly presents a challenge to debug work required during lab bring-up and test bring-up. Traditional multi-processing systems reap the benefit of standard system level debug practices, but as the system has moved into the silicon so must the access during bring-up. This paper explains some of the innovative debug features included in the CELL processor design that were critical for efficient bring-up in a limited access environment
Keywords :
integrated circuit testing; logic testing; microprocessor chips; system-on-chip; CELL processor debug; lab bring-up; limited access environment; test bring-up; Art; Bandwidth; Clocks; Hardware; Logic testing; Process design; Production; Semiconductor device testing; Silicon; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2006.297671
Filename :
4079349
Link To Document :
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