DocumentCode
3360251
Title
A wide-band microstrip-to-microstrip multi-layered via transition using LTCC technology
Author
Tsai, Chih-Chun ; Cheng, Yung-Shou ; Huang, Ting-Yi ; Wu, Ruey-Beei
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2009
fDate
2-4 Dec. 2009
Firstpage
1
Lastpage
4
Abstract
A wide-band microstrip-to-microstrip via transition used for connecting integrated circuits and antenna array in a multi-layered low-temperature co-fired ceramic substrate is investigated in this paper. The via transition is decomposed into external and internal segments to facilitate the design. The equivalent impedance of internal segment, consisting of multi-layered through-hole via with four ground vias, is calculated from the lump-circuit model generated by Ansoft Q3D Extractor. The electrical performance of the external segment, consisting of via to microstrip lines, is evaluated by the microstrip-to-coax transition to choose appropriate via physical parameters. Finally, the geometrical parameters of entire transition are obtained by combining the results of the external and internal segments. It has been demonstrated, through the simulation results by commercial software Ansoft HFSS, that the return loss is better than 19 dB over a band from DC up to 70 GHz with an in-band insertion loss better than 0.48 dB.
Keywords
interconnections; microstrip transitions; Ansoft Q3D Extractor; LTCC technology; antenna array; commercial software Ansoft HFSS; equivalent impedance; inband insertion loss; integrated circuits; lump circuit model; microstrip lines; microstrip-to-coax transition; multilayered low-temperature co-fired ceramic substrate; return loss; wide-band microstrip-to-microstrip multilayered via transition; Antenna arrays; Ceramics; Coaxial components; Dielectric substrates; Impedance; Insertion loss; Integrated circuit technology; Microstrip antenna arrays; Microstrip antennas; Wideband; LTCC; via-transition; wide-band interconnects;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Design of Advanced Packaging & Systems Symposium, 2009. (EDAPS 2009). IEEE
Conference_Location
Shatin, Hong Kong
Print_ISBN
978-1-4244-5350-4
Electronic_ISBN
978-1-4244-5351-1
Type
conf
DOI
10.1109/EDAPS.2009.5403997
Filename
5403997
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