Title :
A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision
Author :
Copani, T. ; Vermeire, B. ; Jain, A. ; Karaki, H. ; Chandrashekar, K. ; Goswami, S. ; Kitchen, J. ; Chung, H.H. ; Deligoz, I. ; Bakkaloglu, B. ; Barnaby, H. ; Kiaei, S.
Author_Institution :
Arizona State Univ., Tempe, AZ
Abstract :
A monolithic pulsed time-of-flight measurement system is presented in this paper. The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-mum BiCMOS process. The receiver front-end achieves a 2.3 GHz bandwidth and NF lower than 5 dB. The system shows a single-shot precision of 12 ps and a measurement range of 188 mus. The measurement rate can be as high as 700 kHz. The power consumption is 148 mA from a 3.5 V supply for analog and E2CL circuitry, and a 1.8 V supply for CMOS circuitry.
Keywords :
BiCMOS integrated circuits; analogue-digital conversion; integrated optoelectronics; measurement by laser beam; photodetectors; BiCMOS process; IC fabrication; analog circuitry; frequency 2.3 GHz; fully integrated pulsed-LASER time-of-flight measurement system; optical receiver front-end; pulse amplitude detector; size 0.18 mum; time 12 ps; time-to-digital converter; Bandwidth; BiCMOS integrated circuits; Detectors; Energy consumption; Error correction; Integrated circuit measurements; Noise measurement; Optical pulses; Optical receivers; Pulse measurements;
Conference_Titel :
Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2018-6
Electronic_ISBN :
978-1-4244-2019-3
DOI :
10.1109/CICC.2008.4672096
