• DocumentCode
    3360462
  • Title

    Novel I/O-bump design and optimization for chip-package codesign

  • Author

    Lee, Ren-jie ; Chen, Hung-Ming

  • Author_Institution
    Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2009
  • fDate
    2-4 Dec. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    While the advanced very large scale integration (VLSI) circuit is scaling to deep-submicrometer (DSM) technology, the I/O placement plays a key role in affecting the die size and interconnect. The flip-chip area-array ICs meet the requirements of higher I/O density and lower parasitic effects, but essentially need the optimized I/O and bump placement. In this paper we skip the redistribution layer (RDL) routing and design the specific I/O-bump tiles based on an innovative I/O-row scheme. By considering the package ball location, our proposed I/O-bump planning methodologies produce a package-aware I/O-bump location for chip-level core cell placement and package-level routing task. Thus, our algorithms provide the concurrent chip-package coplanning/codesign flow and dramatically speed up the design process. The experimental results show that our methods optimize the performance metrics in designing the interface between chip and package, such as the net crossing, total wirelength and length deviation.
  • Keywords
    VLSI; electronics packaging; flip-chip devices; I/O placement; I/O-bump design; I/O-row scheme; VLSI circuit; chip-level core cell placement; chip-package codesign; deep-submicrometer technology; flip-chip area-array IC; package-aware I/O-bump location; package-level routing; parasitic effect; Algorithm design and analysis; Circuits; Design optimization; Measurement; Packaging; Process planning; Routing; Technology planning; Tiles; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging & Systems Symposium, 2009. (EDAPS 2009). IEEE
  • Conference_Location
    Shatin, Hong Kong
  • Print_ISBN
    978-1-4244-5350-4
  • Electronic_ISBN
    978-1-4244-5351-1
  • Type

    conf

  • DOI
    10.1109/EDAPS.2009.5404007
  • Filename
    5404007