Title :
Precise analysis and modeling of far-end crosstalk and far-end crosstalk saturation using mode analysis in coupled microstrip lines
Author :
Kim, Gawon ; Song, Eakhwan ; Kim, Jiseong ; Kim, Joungho
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., KAIST (Korea Adv. Inst. of Sci. & Technol.), Daejeon, South Korea
Abstract :
In this paper, the mode analysis method has been proposed and model the precise FEXT waveform. Using this method, FEXT saturation phenomenon can be explained and the precise FEXT equations are proposed depending on the relationship between the velocity difference of even- and odd-mode and the initial rising time of the input step pulse. Saturated FEXT level with increased duration were verified by the crosstalk simulation in two coupled microstrip-type transmission lines. The modeled FEXT and TDT waveforms by the mode analysis method show a good correlation with the measured waveforms.
Keywords :
crosstalk; microstrip lines; waveform analysis; FEXT saturation; FEXT waveform; coupled microstrip-type transmission lines; far-end crosstalk saturation; mode analysis; precise analysis; velocity difference; Coupled mode analysis; Couplings; Crosstalk; Distributed parameter circuits; Equations; Frequency; Impedance; Microstrip; Signal analysis; Voltage;
Conference_Titel :
Electrical Design of Advanced Packaging & Systems Symposium, 2009. (EDAPS 2009). IEEE
Conference_Location :
Shatin, Hong Kong
Print_ISBN :
978-1-4244-5350-4
Electronic_ISBN :
978-1-4244-5351-1
DOI :
10.1109/EDAPS.2009.5404010