Title :
Very-Low Voltage (VLV) and VLV Ratio (VLVR) Testing for Quality, Reliability, and Outlier Detection
Author :
Roehr, Jeffrey L.
Author_Institution :
Analog Devices, Wilmington, MA
Abstract :
A new implementation of very-low voltage (VLV) and minimum voltage (Min_Vdd) testing, the VLV ratio test (VLVR) is proposed to improve product quality and reliability by detecting fabrication and test outliers. The VLVR technique was also used to assist in the diagnosis of a stress induced failure mechanism in a 0.13 micron low power (LP) CMOS process
Keywords :
CMOS integrated circuits; failure analysis; fault diagnosis; integrated circuit reliability; integrated circuit testing; low-power electronics; VLV ratio testing; low power CMOS process; minimum voltage testing; outlier detection; product quality; product reliability; stress induced failure mechanism; very-low voltage; CMOS process; Delay; Fabrication; Failure analysis; Integrated circuit testing; Low voltage; Qualifications; Random access memory; Stress; Temperature;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297690
