DocumentCode :
3360641
Title :
BIST Power Reduction Using Scan-Chain Disable in the Cell Processor
Author :
Zoellin, Christian ; Wunderlich, Hans-Joachim ; Maeding, Nicolas ; Leenstra, Jens
Author_Institution :
Inst. fur Technische Informatik, Univ. Stuttgart
fYear :
2006
fDate :
Oct. 2006
Firstpage :
1
Lastpage :
8
Abstract :
Built-in self test is a major part of the manufacturing test procedure for the cell processor. However, pseudo random patterns cause a high switching activity which is not effectively reduced by standard low power design techniques. If special care is not taken, the scan-speed may have to be reduced significantly, thus extending test time and costs. In this paper, we describe a test power reduction method for logic BIST which uses test scheduling, planning and scan-gating. In LBIST, effective patterns that detect additional faults are very scarce after a few dozens of scan cycles and often less than one pattern in a hundred detects new faults. In most cases, such an effective pattern requires only a reduced set of the available scan chains to detect the fault and all don´t-care scan chains can be disabled, therefore significantly reducing test power
Keywords :
automatic test pattern generation; boundary scan testing; built-in self test; fault diagnosis; integrated circuit testing; logic testing; low-power electronics; microprocessor chips; built-in self test; cell processor; fault detection; logic BIST; low power design techniques; manufacturing test procedure; planning; pseudo random patterns; scan-chain disable; scan-gating; switching activity; test scheduling; Built-in self-test; Circuit faults; Circuit testing; Clocks; Energy consumption; Fault detection; Flip-flops; Logic testing; Power generation; Test pattern generators; BIST; Microprocessor test; low power test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2006.297695
Filename :
4079373
Link To Document :
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