Title :
A million cycle 0.13um 1Mb embedded SONOS Flash memory using Successive Approximated Read Calibration
Author :
Wang, N. ; Yao, X. ; Lei, Y. ; Feng, G.Y. ; Dong, Q.H. ; Xu, L. ; Guo, L. ; Wang, Z. ; Tang, T.S.
Author_Institution :
Shanghai Hua Hong NEC Electron. Co., Ltd., Shanghai
Abstract :
A 1 Mb embedded 2T-SONOS Flash macro is implemented in 0.13 um logic compatible process. The Flash macro has improved reliability and yield with a power-on Successive Approximated Read Calibration (SARC). Word-line decoder area is greatly reduced using 1.8 V transistors to tolerate high voltage. Source degenerated compensation is implemented to enhance read margin. The Flash macro consumes 1.0 mA at 50 ns 1.8 V access and 0.5 uA in standby mode, and achieves one million cycling and 20-year data retention.
Keywords :
CMOS memory circuits; embedded systems; flash memories; SARC; embedded SONOS flash memory; flash macro reliability; size 0.13 mum; source degenerated compensation; storage capacity 1 Mbit; successive approximated read calibration; word-line decoder area; Calibration; Decoding; Driver circuits; Flash memory; Logic; National electric code; SONOS devices; Smart cards; Temperature sensors; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2018-6
Electronic_ISBN :
978-1-4244-2019-3
DOI :
10.1109/CICC.2008.4672111
