• DocumentCode
    3360681
  • Title

    The growth rate of EHD instabilities induced by unipolar injection

  • Author

    Watson, P. Keith

  • Author_Institution
    Xerox Corp., Webster, NY, USA
  • fYear
    1996
  • fDate
    15-19 Jul 1996
  • Firstpage
    49
  • Lastpage
    52
  • Abstract
    Transient electrohydrodynamic instabilities in liquid dielectrics have been studied by using an electron beam as an injecting contact. A primary beam injects a uniform pulse of charge into the free surface of the liquid film, and a second beam, directed across the liquid surface, monitors the surface potential of the sample. The pulse charging method of measurement used in these experiments has several advantages over the constant current method: (i) the onset of EHD instability is well defined; (ii) charge decay at injection levels below the instability onset provides a measure of the negative ion mobility in the fluid; (iii) the growth rate of the instability can be measured. Above the EHD instability onset, for a short time after the charging pulse the decay follows the SCL model, but after a time delay the decay rate increases as convective motion sets in and enhances the rate of charge decay. From the charge dependence of charge decay we can deduce the field dependence of the growth rate
  • Keywords
    dielectric liquids; electrohydrodynamics; flow instability; ion mobility; ionic conductivity; space charge; surface potential; transient analysis; transients; EHD instability growth rate; EHD instability onset; SCL model; charge decay rate; convective motion; electron beam injecting contact; field dependence; liquid dielectrics; negative ion mobility; pulse charging method; surface potential; transient electrohydrodynamic instabilities; uniform charge pulse; unipolar injection; Charge measurement; Current measurement; Dielectric liquids; Dielectric materials; Electrodes; Electron beams; Electron traps; Pulse measurements; Space charge; Surface charging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Dielectric Liquids, 1996, ICDL '96., 12th International Conference on
  • Conference_Location
    Roma
  • Print_ISBN
    0-7803-3560-0
  • Type

    conf

  • DOI
    10.1109/ICDL.1996.565315
  • Filename
    565315