Title :
A 0.13μm CMOS fully differential receiver with on-chip baluns for 60GHz broadband wireless communications
Author :
Wang, Chao-Shiun ; Huang, Juin-Wei ; Chu, Kun-Da ; Wang, Chorng-Kuang
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
Abstract :
This paper presents a fully differential receiver with on-chip baluns for 60 GHz broadband wireless applications. This design consists of on-chip baluns, gm-boosted current-reuse low-noise amplifier (LNA), sub-harmonic dual-gate down conversion mixer, second IF mixer and baseband gain stage. Fully differential circuit technique is adopted to obtain good common mode performance. The gm-boosted current-reuse differential LNA mitigates the noise, gain, robustness, stability, and integration issues associated with previous solutions. The sub-harmonic dual-gate down conversion mixer prevents the issue of the third harmonic of the LO as well. The measured conversion gain and input P1dB of the proposed receiver are 30 dB and -27 dBm, respectively. The measured noise figure at 100 MHz baseband output is around 10 dB. The proposed 60 GHz receiver dissipates 44 mW with a 1.2 V supply voltage. The fully differential receiver with the on-chip baluns is implemented in a standard 0.13 mum 1P8M+ RF CMOS technology.
Keywords :
CMOS integrated circuits; baluns; broadband networks; low noise amplifiers; millimetre wave mixers; millimetre wave receivers; CMOS fully differential receiver; LNA; baseband gain stage; broadband wireless communications; frequency 100 MHz; frequency 60 GHz; fully differential circuit technique; gain 30 dB; gm-boosted current-reuse low-noise amplifier; on-chip baluns; power 44 mW; second IF mixer; subharmonic dual-gate down conversion mixer; voltage 1.2 V; Baseband; Broadband communication; CMOS technology; Circuit noise; Circuit stability; Impedance matching; Low-noise amplifiers; Noise robustness; Robust stability; Wireless communication; Current-reuse; Dual-gate; Gm-boosting; LNA; MIXER; Receiver; Sub-harmonic;
Conference_Titel :
Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2018-6
Electronic_ISBN :
978-1-4244-2019-3
DOI :
10.1109/CICC.2008.4672125