Title :
Situation assessment and decision making integrated into the process centered environment
Author :
White, Stephanie ; Dorchak, Susan ; Keane, John ; Pallack, William ; Owens, Jerry ; Rozenblit, Jerzy ; Davis, James ; Sztipanovits, Janos
Author_Institution :
Long Island Univ., New York, NY, USA
Abstract :
Researchers have defined a number of process modeling methods and have developed in-roads to process centered environments that support process modeling and project control. However, there is little research that incorporates variability of the human condition into process modeling. The negative effects of numerous variables on the quality of human situation assessment and decision making can be as detrimental to expected results as any catastrophic failure. The research documented in the paper proposes a model for situation assessment, and derives a taxonomy of individual, task, environmental, and organizational attributes that can affect situation assessment and decision making. The model and attributes are integrated with a state based process modeling paradigm. The MultiGraph Architecture, Vanderbilt University´s model integrated computing environment, was used quickly and cost effectively to generate a graphical process modeling environment that accounts for situation assessment and decision making
Keywords :
human factors; programming environments; social aspects of automation; visual programming; MultiGraph Architecture; catastrophic failure; decision making; expected results; graphical process modeling environment; human condition; human situation assessment; model integrated computing environment; organizational attributes; process centered environment; process modeling methods; project control; state based process modeling paradigm; Computer architecture; Customer satisfaction; Decision making; Design engineering; Forward contracts; Humans; Performance evaluation; Software tools; Systems engineering and theory; Taxonomy;
Conference_Titel :
Engineering of Computer-Based Systems, 1999. Proceedings. ECBS '99. IEEE Conference and Workshop on
Conference_Location :
Nashville, TN
Print_ISBN :
0-7695-0028-5
DOI :
10.1109/ECBS.1999.755871