Title :
Super-resolution: Imaging beyond the pixel size limit
Author :
Elkhatib, Tamer A. ; Salama, Khaled N.
Author_Institution :
Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY
Abstract :
We have implemented a new high resolution imaging system independent of the image sensorpsilas pixel size. This super-resolution is achieved by integrating a nano-aperture patterned in the first metal layer within the pixel using a standard CMOS process. The image sensorpsilas focal plane is scanned with a sub-micron step to obtain the super-resolution image. To experimentally verify the operation of our technique, we have fabricated a standard 3-Transistors (3T) active pixel sensors with integrated nano-apertures in a 0.13 mum CMOS technology. Here, we describe the concept of our super-resolution imaging and elaborate on our fabricated design and experimental setup.
Keywords :
CMOS image sensors; focal planes; image resolution; CMOS image sensor; focal planes; pixel size limit; size 0.13 mum; super-resolution imaging; CMOS technology; Digital images; High-resolution imaging; Image resolution; Image sensors; Lenses; Optical imaging; Optical sensors; Pixel; Signal resolution;
Conference_Titel :
Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2018-6
Electronic_ISBN :
978-1-4244-2019-3
DOI :
10.1109/CICC.2008.4672135