• DocumentCode
    3361068
  • Title

    Super-resolution: Imaging beyond the pixel size limit

  • Author

    Elkhatib, Tamer A. ; Salama, Khaled N.

  • Author_Institution
    Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY
  • fYear
    2008
  • fDate
    21-24 Sept. 2008
  • Firstpage
    515
  • Lastpage
    518
  • Abstract
    We have implemented a new high resolution imaging system independent of the image sensorpsilas pixel size. This super-resolution is achieved by integrating a nano-aperture patterned in the first metal layer within the pixel using a standard CMOS process. The image sensorpsilas focal plane is scanned with a sub-micron step to obtain the super-resolution image. To experimentally verify the operation of our technique, we have fabricated a standard 3-Transistors (3T) active pixel sensors with integrated nano-apertures in a 0.13 mum CMOS technology. Here, we describe the concept of our super-resolution imaging and elaborate on our fabricated design and experimental setup.
  • Keywords
    CMOS image sensors; focal planes; image resolution; CMOS image sensor; focal planes; pixel size limit; size 0.13 mum; super-resolution imaging; CMOS technology; Digital images; High-resolution imaging; Image resolution; Image sensors; Lenses; Optical imaging; Optical sensors; Pixel; Signal resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2018-6
  • Electronic_ISBN
    978-1-4244-2019-3
  • Type

    conf

  • DOI
    10.1109/CICC.2008.4672135
  • Filename
    4672135