Title :
Multiple paths sensitization of digital oscillation built-in self test
Author :
Dufaza, Christian
Author_Institution :
Lab. d´´Inf., de Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Abstract :
Digital oscillation built-in self test (DOBIST) deals with testing path delay, gate delay and stuck-at faults in digital integrated circuits. This test methodology consists of sensitizing paths in the circuit under test so that they can oscillate as ring oscillators. While the 1st version of DOBIST is limited to single path sensitization equations reported in this paper allow concurrent multiple paths sensitization. It results a simplification of the test generation procedure and a significant decrease of the test time
Keywords :
built-in self test; delays; digital integrated circuits; logic testing; digital integrated circuits; digital oscillation built-in self test; gate delay testing; multiple path sensitization; path delay testing; ring oscillators; stuck-at fault testing; test generation procedure; test time; Automatic testing; Circuit faults; Circuit testing; Delay effects; Equations; Isolation technology; Propagation delay; System testing; Test equipment; Timing;
Conference_Titel :
Computer Design, 1999. (ICCD '99) International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-0406-X
DOI :
10.1109/ICCD.1999.808422
