• DocumentCode
    3361182
  • Title

    Multiple paths sensitization of digital oscillation built-in self test

  • Author

    Dufaza, Christian

  • Author_Institution
    Lab. d´´Inf., de Robotique et Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    166
  • Lastpage
    174
  • Abstract
    Digital oscillation built-in self test (DOBIST) deals with testing path delay, gate delay and stuck-at faults in digital integrated circuits. This test methodology consists of sensitizing paths in the circuit under test so that they can oscillate as ring oscillators. While the 1st version of DOBIST is limited to single path sensitization equations reported in this paper allow concurrent multiple paths sensitization. It results a simplification of the test generation procedure and a significant decrease of the test time
  • Keywords
    built-in self test; delays; digital integrated circuits; logic testing; digital integrated circuits; digital oscillation built-in self test; gate delay testing; multiple path sensitization; path delay testing; ring oscillators; stuck-at fault testing; test generation procedure; test time; Automatic testing; Circuit faults; Circuit testing; Delay effects; Equations; Isolation technology; Propagation delay; System testing; Test equipment; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 1999. (ICCD '99) International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-6404
  • Print_ISBN
    0-7695-0406-X
  • Type

    conf

  • DOI
    10.1109/ICCD.1999.808422
  • Filename
    808422
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3361182